Fremgangsmåde til bestemmelse af et samlet kapacitetstab af en sekundær celle

A method for determining an overall loss of capacitance of a secondary cell, for example of an accumulator, which is brought about by ageing processes is provided. The overall loss of capacitance is determined additively from partial losses of capacitance which are determined by means of various parameters from various functions. A partial loss of capacitance is determined under constant peripheral conditions. If the peripheral conditions change, the partial losses of capacitance follow one another directly, i.e. with respect to the same loss of capacitance. The interval of the respective charge throughput rate is shifted here. The overall loss of capacitance of a secondary cell can be extended to the overall loss of capacitance of a package composed of a plurality of secondary cells.