Todimensionalt brydningsgitter til alternerende flerlagsstabling og spektro-skopisk apparat med dette gitter
The grating has a periodicity structure (4) carried by a surface (3) of a substrate (2). Two periodic thin layer stackings (5, 6) of periods d1 and d2, respectively, are constituted of layers of two different materials, where the stackings form parallel traces separated from the surface and spaced p...
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| creator | LIARD-CLOUP, AUDREY IDIR, MOURAD POLACK, FRANCOIS JOURDAIN, ERICK |
| description | The grating has a periodicity structure (4) carried by a surface (3) of a substrate (2). Two periodic thin layer stackings (5, 6) of periods d1 and d2, respectively, are constituted of layers of two different materials, where the stackings form parallel traces separated from the surface and spaced periodically. The layers of the two stackings are placed alternative to each other. Independent claims are also included for the following: (A) a method of fabrication of a diffraction grating (B) a spectroscopic device for analyzing or filtering a light source comprising a diffraction grating. |
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Two periodic thin layer stackings (5, 6) of periods d1 and d2, respectively, are constituted of layers of two different materials, where the stackings form parallel traces separated from the surface and spaced periodically. The layers of the two stackings are placed alternative to each other. Independent claims are also included for the following: (A) a method of fabrication of a diffraction grating (B) a spectroscopic device for analyzing or filtering a light source comprising a diffraction grating.</description><language>dan</language><subject>COLORIMETRY ; GAMMA RAY OR X-RAY MICROSCOPES ; IRRADIATION DEVICES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; NUCLEAR ENGINEERING ; NUCLEAR PHYSICS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110919&DB=EPODOC&CC=DK&NR=1700141T3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110919&DB=EPODOC&CC=DK&NR=1700141T3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIARD-CLOUP, AUDREY</creatorcontrib><creatorcontrib>IDIR, MOURAD</creatorcontrib><creatorcontrib>POLACK, FRANCOIS</creatorcontrib><creatorcontrib>JOURDAIN, ERICK</creatorcontrib><title>Todimensionalt brydningsgitter til alternerende flerlagsstabling og spektro-skopisk apparat med dette gitter</title><description>The grating has a periodicity structure (4) carried by a surface (3) of a substrate (2). 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| subjects | COLORIMETRY GAMMA RAY OR X-RAY MICROSCOPES IRRADIATION DEVICES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING |
| title | Todimensionalt brydningsgitter til alternerende flerlagsstabling og spektro-skopisk apparat med dette gitter |
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