Todimensionalt brydningsgitter til alternerende flerlagsstabling og spektro-skopisk apparat med dette gitter

The grating has a periodicity structure (4) carried by a surface (3) of a substrate (2). Two periodic thin layer stackings (5, 6) of periods d1 and d2, respectively, are constituted of layers of two different materials, where the stackings form parallel traces separated from the surface and spaced p...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	LIARD-CLOUP, AUDREY, IDIR, MOURAD, POLACK, FRANCOIS, JOURDAIN, ERICK
Format:	Patent
Sprache:	dan
Schlagworte:	COLORIMETRY GAMMA RAY OR X-RAY MICROSCOPES IRRADIATION DEVICES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The grating has a periodicity structure (4) carried by a surface (3) of a substrate (2). Two periodic thin layer stackings (5, 6) of periods d1 and d2, respectively, are constituted of layers of two different materials, where the stackings form parallel traces separated from the surface and spaced periodically. The layers of the two stackings are placed alternative to each other. Independent claims are also included for the following: (A) a method of fabrication of a diffraction grating (B) a spectroscopic device for analyzing or filtering a light source comprising a diffraction grating.