Apparat og fremgangsmåde til måleanordning til overflader med fri form

Measuring apparatus for measuring a position of a device (2) that is rotatable relative to a movable stage (3), comprising: a measurement frame (4) and a contactless distance measurement device (5) for measuring in said first direction a distance between said measurement frame and a predetermined me...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	ROSIELLE, PETRUS, CAROLUS, JOHANNES, NICOLAAS, HENSELMANS, RENS
Format:	Patent
Sprache:	dan
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	Measuring apparatus for measuring a position of a device (2) that is rotatable relative to a movable stage (3), comprising: a measurement frame (4) and a contactless distance measurement device (5) for measuring in said first direction a distance between said measurement frame and a predetermined measurement surface (7) provided on said stage. According to the invention, said predetermined measurement surface is formed by a surface of said rotatable device. The method comprises providing a predetermined measurement surface on a rotatable device; and measuring directly on said rotatable device a first distance between a measurement frame and said predetermined measurement surface. In this way, aspheric or free-form surfaces of optical elements can be measured easily in closed loop without introducing abbe-errors.