Einen Massenspektrometer enthaltender Apparat

Disclosed is an apparatus which can serve to detect, count, size discriminate and analyze the chemical composition of particles in the air or process gases. In a preferred embodiment, the particles enter via a capillary (4 or 5) into a differentially pumped chamber (6). A pulsed laser (10) which is...

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Hauptverfasser: MUJSCE, ANTHONY MICHAEL, BERKELEY HEIGHTS, NEW JERSEY 07922, US, SINCLAIR, JAMES DOUGLAS, SUMMIT, NEW JERSEY 07901, US, REENTS JR., WILLIAM DAVID, MIDDLESEX, NEW JERSEY 08846, US, SWANSON, ALKA, NEW PROVIDENCE, NEW JERSEY 07974, US, MULLER, AMY JEAN, WARREN, NEW JERSEY 07059, US, EMERSON, ADRIAN BRUCE, PISCATAWAY, NEW JERSEY 08854, US, DOWNEY, STEPHEN WARD, CHATHAM, NEW JERSEY 07928, US
Format: Patent
Sprache:ger
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Zusammenfassung:Disclosed is an apparatus which can serve to detect, count, size discriminate and analyze the chemical composition of particles in the air or process gases. In a preferred embodiment, the particles enter via a capillary (4 or 5) into a differentially pumped chamber (6). A pulsed laser (10) which is continuously fired is focused at an opening in the chamber. When the particles come into the path of the laser beam, the particles are fragmented and ionized. A dual time of flight mass spectrum is produced, recorded with an oscilloscope (16) and analyzed with a computer (22). The mass spectrum information enables the determination of the chemical nature and concentration of the species of the particles, the particle size and the elemental composition of airborne particles in real time. Once these parameters are determined the source of the particles can be determined and eliminated from the environment and process. Thus, the inventive apparatus is advantageouslyused in conjunction with a facility i.e., a semiconductor manufacturing facility, that requires ultra-clean conditions.