CVD-Reaktor und Verfahren zu dessen Verwendung

Each of a plurality of individually heated circularly located susceptors supports and heats one of a plurality of wafers within a processing chamber. An overhead gas dispersion head, vertically aligned with each susceptor, directs, in combination with downstream flow control structure, flow of a rea...

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Hauptverfasser: MAZAK, WILLIAM A., MESA, ARIZONA 85210, US, CURTIN, JOHN H., PHOENIX, ARIZONA 85023, US, HEY, H. PETER W., PHOENIX, ARIZONA 85044, US, AGGARWAL, RAVINDER K., MESA, ARIZONA 85202, US, SMITH, JOE R., TEMPE, ARIZONA 85284, US, BROWN, PAUL B., TEMPE, ARIZONA 85282, US
Format: Patent
Sprache:ger
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Zusammenfassung:Each of a plurality of individually heated circularly located susceptors supports and heats one of a plurality of wafers within a processing chamber. An overhead gas dispersion head, vertically aligned with each susceptor, directs, in combination with downstream flow control structure, flow of a reactant gas radially uniformly across the supported wafer. A spider sequentially relocates each of the wafers, as a group, to an adjacent susceptor. Wafer handling apparatus replaces each processed wafer to provide a high production rate throughput. A source of RF energy radiating essentially primarily between each gas dispersion head and its associated susceptor provides a plasma enhanced environment and the low level intensity elsewhere within the reactor reduces residual deposits.