Apparat zum optischen Profilieren eines Gegenstands

Apparat zum optischen Profilieren eines Gegenstands

An apparatus and method for mapping the profile of an object, e.g. an evelope flap 56 use an array of sensors of the optical reflective type. Certain optical emitters and certain optical detectors are activated in a sequence to accurately detect and record multiple points on the edge 59 of the movin...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: TOLMIE, ROBERT J., JR., BROOKFIELD CONNECTICUT 06804, US
Format: Patent
Sprache:ger
Schlagworte:
BUREAU ACCESSORIES
BUREAU ACCESSORIES NOT OTHERWISE PROVIDED FOR
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PERFORMING OPERATIONS
PHYSICS
TESTING
TRANSPORTING
WRITING OR DRAWING IMPLEMENTS
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Beschreibung
Zusammenfassung:An apparatus and method for mapping the profile of an object, e.g. an evelope flap 56 use an array of sensors of the optical reflective type. Certain optical emitters and certain optical detectors are activated in a sequence to accurately detect and record multiple points on the edge 59 of the moving flap.