Vorrichtung zur Temperaturmessung

An apparatus includes a substrate (300) and a resistive element (310) attached to a region of the substrate (300) and formed of a first material (402, 500) having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces (326) coupled to the resistive eleme...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: GIERE, MATTHEW D, PRAKASH, SATYA, BARBOUR, MICHAEL J
Format: Patent
Sprache:ger
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Zusammenfassung:An apparatus includes a substrate (300) and a resistive element (310) attached to a region of the substrate (300) and formed of a first material (402, 500) having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces (326) coupled to the resistive element (310), attached to the substrate (300), and formed of a second material (404, 502) having a second temperature coefficient of resistivity with the first material (402, 500) selected so that the first temperature coefficient of resistivity exceeds the second temperature coefficient of resistivity. An apparatus includes a substrate (300) and a resistive element (310) disposed onto a first region of the substrate (300) and formed of a first material (402, 500) having a first temperature coefficient of resistivity. In addition, the apparatus includes a pair of traces (326) coupled to the resistive element (310) and each formed of a first plurality of sections (Fig. 5A, Fig. 5B) of a second material (404, 502) having a second temperature coefficient of resistivity and a second plurality of sections (Fig. 5A, Fig. 5B) of a third material having a third temperature coefficient of resistivity.