Plasma-Manipulator

The invention relates to a device for emission spectrum analysis with an analysis plasma containing the analysis sample and a spectrometer suitable for emission measurements, in which there is a plasma manipulator (4) with a cooled diaphragm (8) concentric with the axis (7) and perpendicular to the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	FALK, HEINZ, DR., 47533 KLEVE, DE
Format:	Patent
Sprache:	ger
Schlagworte:	ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PLASMA TECHNIQUE PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to a device for emission spectrum analysis with an analysis plasma containing the analysis sample and a spectrometer suitable for emission measurements, in which there is a plasma manipulator (4) with a cooled diaphragm (8) concentric with the axis (7) and perpendicular to the direction of expansion of the plasma with a free diameter smaller than that of the plasma which allows only the central part (6) or only the optical part of the analysis plasma to pass and masks off the remaining region, and an observation device (3) for the radiation emission of the volume of plasma allowed through.