Apparat und Verfahren für das berührungslose Messen der Diameter, der Stumpfheit und der Position der Spritze eines Bohrers
A laser based, noncontacting measurement instrument particularly adapted for the printed circuit board drilling industry is disclosed. The instrument accurately measures drill diameter, runout, and tip position under actual operating conditions. A laser beam is focused in space and the amount of lig...
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| creator | JALKIO, JEFFREY A., ST. PAUL, MINNESOTA 55105, US CASE, STEVEN K., ST. LOUIS PARK, MINNESOTA 55416, US SKUNES, TIMOTHY A., COLUMBIA HEIGHTS, MINNESOTA 55421, US |
| description | A laser based, noncontacting measurement instrument particularly adapted for the printed circuit board drilling industry is disclosed. The instrument accurately measures drill diameter, runout, and tip position under actual operating conditions. A laser beam is focused in space and the amount of light occluded by the drill bit as the bit is passed through the beam is sensed by a detector. Diameter, runout, and tip position are calculated by measuring the amount of occlusion, monitoring the angular orientation of the rotating drill; and correlating the amount of light occlusion to the angular orientation of the drill. The instrument automatically compensates for dust and debris in the optical path. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_DE439907TT1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>DE439907TT1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_DE439907TT13</originalsourceid><addsrcrecordid>eNqNjTEKwkAURNNYiHqHfwAFJYJYqonYCEKCbVjNxCwku8v_m0bwZulyMaPxAFbDzDxmxsFr55xi5akxOV3BhSoZhoquZcqV0A3ctSU35iGVFdAZIn2fgynSqoYHz78u8U3tihJ6mPpEFyvaazvQiWPtnyBoA6G97W9YpsGoUJVg9tNJQMc4PZwWcDaDOHWHgc-ieB1ut8tNmq7CP5A3eD5JEQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparat und Verfahren für das berührungslose Messen der Diameter, der Stumpfheit und der Position der Spritze eines Bohrers</title><source>esp@cenet</source><creator>JALKIO, JEFFREY A., ST. PAUL, MINNESOTA 55105, US ; CASE, STEVEN K., ST. LOUIS PARK, MINNESOTA 55416, US ; SKUNES, TIMOTHY A., COLUMBIA HEIGHTS, MINNESOTA 55421, US</creator><creatorcontrib>JALKIO, JEFFREY A., ST. PAUL, MINNESOTA 55105, US ; CASE, STEVEN K., ST. LOUIS PARK, MINNESOTA 55416, US ; SKUNES, TIMOTHY A., COLUMBIA HEIGHTS, MINNESOTA 55421, US</creatorcontrib><description>A laser based, noncontacting measurement instrument particularly adapted for the printed circuit board drilling industry is disclosed. The instrument accurately measures drill diameter, runout, and tip position under actual operating conditions. A laser beam is focused in space and the amount of light occluded by the drill bit as the bit is passed through the beam is sensed by a detector. Diameter, runout, and tip position are calculated by measuring the amount of occlusion, monitoring the angular orientation of the rotating drill; and correlating the amount of light occlusion to the angular orientation of the drill. The instrument automatically compensates for dust and debris in the optical path.</description><edition>5</edition><language>ger</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; PRINTED CIRCUITS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>1994</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19940317&DB=EPODOC&CC=DE&NR=439907T1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19940317&DB=EPODOC&CC=DE&NR=439907T1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JALKIO, JEFFREY A., ST. PAUL, MINNESOTA 55105, US</creatorcontrib><creatorcontrib>CASE, STEVEN K., ST. LOUIS PARK, MINNESOTA 55416, US</creatorcontrib><creatorcontrib>SKUNES, TIMOTHY A., COLUMBIA HEIGHTS, MINNESOTA 55421, US</creatorcontrib><title>Apparat und Verfahren für das berührungslose Messen der Diameter, der Stumpfheit und der Position der Spritze eines Bohrers</title><description>A laser based, noncontacting measurement instrument particularly adapted for the printed circuit board drilling industry is disclosed. The instrument accurately measures drill diameter, runout, and tip position under actual operating conditions. A laser beam is focused in space and the amount of light occluded by the drill bit as the bit is passed through the beam is sensed by a detector. Diameter, runout, and tip position are calculated by measuring the amount of occlusion, monitoring the angular orientation of the rotating drill; and correlating the amount of light occlusion to the angular orientation of the drill. The instrument automatically compensates for dust and debris in the optical path.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>PRINTED CIRCUITS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1994</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjTEKwkAURNNYiHqHfwAFJYJYqonYCEKCbVjNxCwku8v_m0bwZulyMaPxAFbDzDxmxsFr55xi5akxOV3BhSoZhoquZcqV0A3ctSU35iGVFdAZIn2fgynSqoYHz78u8U3tihJ6mPpEFyvaazvQiWPtnyBoA6G97W9YpsGoUJVg9tNJQMc4PZwWcDaDOHWHgc-ieB1ut8tNmq7CP5A3eD5JEQ</recordid><startdate>19940317</startdate><enddate>19940317</enddate><creator>JALKIO, JEFFREY A., ST. PAUL, MINNESOTA 55105, US</creator><creator>CASE, STEVEN K., ST. LOUIS PARK, MINNESOTA 55416, US</creator><creator>SKUNES, TIMOTHY A., COLUMBIA HEIGHTS, MINNESOTA 55421, US</creator><scope>EVB</scope></search><sort><creationdate>19940317</creationdate><title>Apparat und Verfahren für das berührungslose Messen der Diameter, der Stumpfheit und der Position der Spritze eines Bohrers</title><author>JALKIO, JEFFREY A., ST. PAUL, MINNESOTA 55105, US ; CASE, STEVEN K., ST. LOUIS PARK, MINNESOTA 55416, US ; SKUNES, TIMOTHY A., COLUMBIA HEIGHTS, MINNESOTA 55421, US</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE439907TT13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>1994</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>PRINTED CIRCUITS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JALKIO, JEFFREY A., ST. PAUL, MINNESOTA 55105, US</creatorcontrib><creatorcontrib>CASE, STEVEN K., ST. LOUIS PARK, MINNESOTA 55416, US</creatorcontrib><creatorcontrib>SKUNES, TIMOTHY A., COLUMBIA HEIGHTS, MINNESOTA 55421, US</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JALKIO, JEFFREY A., ST. PAUL, MINNESOTA 55105, US</au><au>CASE, STEVEN K., ST. LOUIS PARK, MINNESOTA 55416, US</au><au>SKUNES, TIMOTHY A., COLUMBIA HEIGHTS, MINNESOTA 55421, US</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparat und Verfahren für das berührungslose Messen der Diameter, der Stumpfheit und der Position der Spritze eines Bohrers</title><date>1994-03-17</date><risdate>1994</risdate><abstract>A laser based, noncontacting measurement instrument particularly adapted for the printed circuit board drilling industry is disclosed. The instrument accurately measures drill diameter, runout, and tip position under actual operating conditions. A laser beam is focused in space and the amount of light occluded by the drill bit as the bit is passed through the beam is sensed by a detector. Diameter, runout, and tip position are calculated by measuring the amount of occlusion, monitoring the angular orientation of the rotating drill; and correlating the amount of light occlusion to the angular orientation of the drill. The instrument automatically compensates for dust and debris in the optical path.</abstract><edition>5</edition><oa>free_for_read</oa></addata></record> |
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| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS PRINTED CIRCUITS TARIFF METERING APPARATUS TESTING |
| title | Apparat und Verfahren für das berührungslose Messen der Diameter, der Stumpfheit und der Position der Spritze eines Bohrers |
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