Method and device for determining the contour of a profile, in particular a plastic-sheathed or coextruded, asymmetrical plastic profile
The invention relates to a method and a device for determining the contour of a profile in the production process, in particular of an asymmetrical plastic-sheathed or coextruded, plastic profile. The core of the invention resides in that the light is projected from at least one light source as a co...
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Format: | Patent |
Sprache: | eng ; ger |
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Zusammenfassung: | The invention relates to a method and a device for determining the contour of a profile in the production process, in particular of an asymmetrical plastic-sheathed or coextruded, plastic profile. The core of the invention resides in that the light is projected from at least one light source as a computer-controlled linear illumination onto the profile at right angles to its longitudinal axis in such a way that the light intensity is constant over the contour, in that, furthermore, the diffusely reflected light fraction is projected onto at least one electrooptic transducer, and in that a computer is used to compare a stored desired value of the profile with the projected actual value of the profile and the result of the comparison is then employed for further use, and in that provision is made of at least one light source (5, 13), a device (6, 14, 15, 16) for generating a linear illumination of constant light intensity over the contour (3a) of the profile (1), at least one optoelectronic transducer (7, 8) and an electronic system for evaluation, comparison and control. |
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