VERFAHREN ZUR ZERSTOERUNGSFREIEN PRUEFUNG DER PRIMAER-SILIZIUM-VERTEILUNG AN DER OBERFLAECHE SILIZIUMHALTIGER ALUMINIUMLEGIERUNGEN

The invention provides a method of testing silicon distribution in aluminium-silicon alloys by drawing a conductor across the surface of the alloy and measuring the changes of electric resistance between the conductor and the alloy.

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Bibliographische Detailangaben
1. Verfasser:	RUEHLE,MARTIN
Format:	Patent
Sprache:	ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention provides a method of testing silicon distribution in aluminium-silicon alloys by drawing a conductor across the surface of the alloy and measuring the changes of electric resistance between the conductor and the alloy.