Digital system testing of functional units - using parity testers for conversion of digital information for identification of defects

Digital system testing of functional units detects and identifies defects and uses parity tests for conversion of digital information. The functional units of the system are provided with parity on the measuring points to be tested. The digital information comprises n bito at a specific point of tim...

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Hauptverfasser: BUDDE,INGO, ARENS,EGIDIUS, PATEL,RAVIN
Format: Patent
Sprache:eng ; ger
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Zusammenfassung:Digital system testing of functional units detects and identifies defects and uses parity tests for conversion of digital information. The functional units of the system are provided with parity on the measuring points to be tested. The digital information comprises n bito at a specific point of timer and is converted to a 1 lib parity signal. The parity signal is compared with a nominal parity signal. Any differences between actual and nominal parities are stored and indicated as defects. If the functional unit is e.g. a shift register, the output signal comprises 8 bits and is defined as measuring point.