Speed of material measuring device - uses laser beams for materials having diffusely reflecting surface
The material speed measuring device uses a laser beam split in two and emitted from equidistant points on both sides of a vertical measurement path to be directed on a point on the material's surface. Frequency shift detectable as modulation are optoelectronically evaluated as the measure for t...
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Format: | Patent |
Sprache: | eng ; ger |
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Zusammenfassung: | The material speed measuring device uses a laser beam split in two and emitted from equidistant points on both sides of a vertical measurement path to be directed on a point on the material's surface. Frequency shift detectable as modulation are optoelectronically evaluated as the measure for the material speed. A telescope with magnification of two to ten is inserted into the laser beam path, so that the laser beam falls on its lens with shorter focal distance and dia. greater than that of the laser beams. It is focussed to a distance greater than the measurement distance. |
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