Arrangement for measuring polarisation dependent optical parameters of rotating specimens

The arrangement consists of devices to generate polarised light, a holder for a rotating specimen (P) and a device for analyzing the light beam reflected from the specimen surface. A spherical mirror (SS) is located in the path of the light beam reflected from the surface of the specimen directly af...

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Hauptverfasser: HABERLAND, KOLJA, 13403 BERLIN, DE, HUNDERI, OLA, .., TRONDHEIM, NO, ZETTLER, JOERG-THOMAS. DR., 13187 BERLIN, DE
Format: Patent
Sprache:eng ; ger
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Zusammenfassung:The arrangement consists of devices to generate polarised light, a holder for a rotating specimen (P) and a device for analyzing the light beam reflected from the specimen surface. A spherical mirror (SS) is located in the path of the light beam reflected from the surface of the specimen directly after the reflecting surface and before the analyzer. The specimen to be investigated is positioned precisely at the centre of curvature of the spherical mirror. The spherical mirror may have a window through which the light beam is projected