Beam arrangement for two beam gas analyser

The arrange has an infrared beam source for a measurement beam and a second infrared beam source for a comparison beam process. The beam sources (201,202) are connected with a common power source (203). Circuits (204,205) are connected with a common clock (207,208) which alternately turns on the cir...

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Bibliographische Detailangaben
Hauptverfasser:	GATZMANGA, HEINZ., 06366 KOETHEN, DE, BASCHANT, DIETER., 06846 DESSAU, DE, HEIMHALT, UWE, 06366 KOETHEN, DE
Format:	Patent
Sprache:	eng ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The arrange has an infrared beam source for a measurement beam and a second infrared beam source for a comparison beam process. The beam sources (201,202) are connected with a common power source (203). Circuits (204,205) are connected with a common clock (207,208) which alternately turns on the circuits. The clock is set to a time using the equation: time in divided by time out equals one. It is connected to a microprocessor control unit (210) which controls a change in the time relationship time in 2/time out 2 for one beam source (202) so that the relationship time in1/time out1 for the other beam source is changed by the same amount but with different sign.