Automatische Konfiguration von Prüf- und Diagnosesystemen

The method involves evaluating a productivity of a configuration by using random samples. The configuration of the pattern recognition system is modified in direction of a more suitable configuration. It is modified with the help of optimization strategies, such as linear or non-linear optimization,...

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Bibliographische Detailangaben
Hauptverfasser: WAGNER, THOMAS, PLANKENSTEINER, PETER, BAUER, NORBERT
Format: Patent
Sprache:ger
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Beschreibung
Zusammenfassung:The method involves evaluating a productivity of a configuration by using random samples. The configuration of the pattern recognition system is modified in direction of a more suitable configuration. It is modified with the help of optimization strategies, such as linear or non-linear optimization, genetic algorithms or genetic programming. The steps are repeated to achieve an iteration to a maximum productivity. Alternatively a learning phase is included in the evaluation, in which a classifier is adjusted through automatically selected learning patterns.