Verfahren zur Abschätzung der Lebensdauer eines Leistungshalbleiter-Bauelements

The load for the component is periodically changed, and the potential difference or the ohmic resistance between two connections of the component is measured according to the number N of load changes. The derivative of potential difference by N or the derivative of resistance w.r.t. N is determined,...

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Bibliographische Detailangaben
1. Verfasser:	FAROKHZAD, BABAK, 83607 HOLZKIRCHEN, DE
Format:	Patent
Sprache:	ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	The load for the component is periodically changed, and the potential difference or the ohmic resistance between two connections of the component is measured according to the number N of load changes. The derivative of potential difference by N or the derivative of resistance w.r.t. N is determined, and the result is compared with the value obtained for a desired lifetime of a reference component. The component under investigation is considered to have a long lifetime of the derivative of potential is less than the reference value and of the derivative of resistance is less than the reference value within the observed interval of load changes. Otherwise the component is considered to have a short lifetime.