Scanning electrochemical microscope for surface analysis and structurisation with high resolution

Apparatus for surface analysis and structurisation consists of a scanning electrochemical microscope containing an electrolyte. The novelty is that the electrolyte contains a substance (I) that reacts with at least one species (II) generated directly or indirectly at the ultramicroelectrode and to a...

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Hauptverfasser:	HEINZE, JUERGEN, DR., 79102 FREIBURG, DE, BORGWARTH, KAI, 79100 FREIBURG, DE, RICKEN, CHRISTOPH, 79114 FREIBURG, DE, EBLING, DIRK., 79112 TIENGEN, DE
Format:	Patent
Sprache:	eng ; ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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creator	HEINZE, JUERGEN, DR., 79102 FREIBURG, DE BORGWARTH, KAI, 79100 FREIBURG, DE RICKEN, CHRISTOPH, 79114 FREIBURG, DE EBLING, DIRK., 79112 TIENGEN, DE
description	Apparatus for surface analysis and structurisation consists of a scanning electrochemical microscope containing an electrolyte. The novelty is that the electrolyte contains a substance (I) that reacts with at least one species (II) generated directly or indirectly at the ultramicroelectrode and to a lesser extent than the educts of the electrode reaction at this electrode. Also claimed are methods for producing microstructures by deposition of a material or by changing a substrate surface, especially by erosion.
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The novelty is that the electrolyte contains a substance (I) that reacts with at least one species (II) generated directly or indirectly at the ultramicroelectrode and to a lesser extent than the educts of the electrode reaction at this electrode. Also claimed are methods for producing microstructures by deposition of a material or by changing a substrate surface, especially by erosion.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
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language	eng ; ger
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subjects	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
title	Scanning electrochemical microscope for surface analysis and structurisation with high resolution
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