Scanning electrochemical microscope for surface analysis and structurisation with high resolution

Apparatus for surface analysis and structurisation consists of a scanning electrochemical microscope containing an electrolyte. The novelty is that the electrolyte contains a substance (I) that reacts with at least one species (II) generated directly or indirectly at the ultramicroelectrode and to a...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	HEINZE, JUERGEN, DR., 79102 FREIBURG, DE, BORGWARTH, KAI, 79100 FREIBURG, DE, RICKEN, CHRISTOPH, 79114 FREIBURG, DE, EBLING, DIRK., 79112 TIENGEN, DE
Format:	Patent
Sprache:	eng ; ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Apparatus for surface analysis and structurisation consists of a scanning electrochemical microscope containing an electrolyte. The novelty is that the electrolyte contains a substance (I) that reacts with at least one species (II) generated directly or indirectly at the ultramicroelectrode and to a lesser extent than the educts of the electrode reaction at this electrode. Also claimed are methods for producing microstructures by deposition of a material or by changing a substrate surface, especially by erosion.