Weft defect detection during fabric manufac - ture

Intensity fluctuations of reflected or transmitted light are transformed in transducers into a proportional ac voltage. The threshold of response of the electronic sensing device for weft defects is given by the mean square of the fluctuations, controlled to a constant value, of the intensity oscill...

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Bibliographische Detailangaben
Hauptverfasser:	REINHARD BLASER, SELL,DIETER
Format:	Patent
Sprache:	eng ; ger
Schlagworte:	FLEXIBLE MATERIALS NOT OTHERWISE PROVIDED FOR INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LAUNDERING MARKING, INSPECTING, SEAMING OR SEVERING TEXTILE MATERIALS MEASURING PHYSICS TESTING TEXTILES TREATMENT OF TEXTILES OR THE LIKE
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Beschreibung
Zusammenfassung:	Intensity fluctuations of reflected or transmitted light are transformed in transducers into a proportional ac voltage. The threshold of response of the electronic sensing device for weft defects is given by the mean square of the fluctuations, controlled to a constant value, of the intensity oscillations brought about by the fabric structure. Optical light guides transmit the light to the transducers.