Testsignal-Erzeugungsvorrichtung

The present invention is to provide a test signal generating apparatus which can generate a test signal for testing a device that dynamically change its operational state in response to a signal or the like. The test signal generating apparatus includes: a pattern storage unit 20 having patterns; a pattern selecting unit 23 for selecting a pattern from among the patterns; a test signal generating unit 25 for generating a test signal having a pattern selected by the pattern selecting unit 23, a trigger signal receiving unit 21 for receiving at least one trigger signal, and a pattern map storage unit 22 having a pattern map defining the number of repetitions for each pattern and a pattern corresponding to a test signal to be generated by the test signal generating unit after the test signal generating unit repeats the test signal on the basis of the number of repetitions.