Optical device for measuring positions has a transparent scale with a measurable scale division to be scanned by a source of light and photodetectors

A transparent scale (1) made from electrically non-conductive material carries an optically scannable measuring scale division (5) scanned by a device (2) with a source (6) of light and photodetectors (8). A transparent electrically conductive layer (11) fits in front of photodetectors to shield the...

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Bibliographische Detailangaben
Hauptverfasser:	ABEL-KEILHACK, CHRISTOF, SCHNEIDER, GISELHER
Format:	Patent
Sprache:	eng ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILSOF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR INSTRUMENT DETAILS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A transparent scale (1) made from electrically non-conductive material carries an optically scannable measuring scale division (5) scanned by a device (2) with a source (6) of light and photodetectors (8). A transparent electrically conductive layer (11) fits in front of photodetectors to shield them from electromagnetic noise fields. Bei einer optischen Positionsmesseinrichtung mit einem Maßstab (1) und einer Abtasteinrichtung (2) werden die Photodetektoren (8) der Abtasteinrichtung (2) durch eine geerdete transparente leitfähige Schicht (11) vor elektromagnetischen Störfeldern geschützt. Diese Schicht (11) ist auf der Oberfläche (4) des Maßstabs (1) aufgebracht, welche den Photodetektoren (8) zugewandt ist (Figur 1).