METHOD OF ALUMINIUM AND SILICON OXIDES COMBINED THIN LAYERS PRODUCTION IN INTERFERENCE SYSTEMS OF LAYERS FOR 2,7 TILL 3,5 MICROMETER WAVELENGTH RANGE

Bibliographische Detailangaben

1. Verfasser:	SKODA VACLAV RNDR.,CS
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
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