DEVICE FOR MATERIALS PARAMETERS MEASURING DURING CRYOGENIC TEMPERATURES

The device enabling measurement of material parameters, e.g. complex permittivity or conductivity at cryogenic temperatures, especially in the field of very high frequencies, is solved. The device consists of the measuring resonator, which contains the measured sample, which is completely or partly from the measured material. The first antenna is connected to the measuring resonator and they are both mounted in the cooling area. The second antenna is located outside the cooling area and it lies in the field of the second antenna and, at the same time, the first antenna lies in the field of the second antenna. The second antenna connects to the duplexer, whose input gate connects with the pulse high-frequency generator and whose output gate connects with the receiver, whose output is connected with the indicator of the input signal.