CIRCUITRY FOR MEASURING PLASTIC DEFORMATIONS CAUSED BY HYSTERESIS LOOP IN DYNAMIC TESTS OF MATERIALS

CIRCUITRY FOR MEASURING PLASTIC DEFORMATIONS CAUSED BY HYSTERESIS LOOP IN DYNAMIC TESTS OF MATERIALS

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Hauptverfasser: CERVENCL,MILAN,CS, KNEIFL,MIROSLAV,CS
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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KNEIFL,MIROSLAV,CS
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title CIRCUITRY FOR MEASURING PLASTIC DEFORMATIONS CAUSED BY HYSTERESIS LOOP IN DYNAMIC TESTS OF MATERIALS
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