A NEW TESTING DEVICE FOR TEMPERATURE PROPERTIES OF ELECTRONIC MATERIAL AND ELEMENTS

The utility model discloses a new auxiliary testing device for the temperature properties of the electronic material and elements, which is composed of a sample frame, a temperature changer and a temperature testing thermocouple. The testing device is suitable for testing low-frequency bands, with s...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YAO XI, YUAN ZHANHENG
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The utility model discloses a new auxiliary testing device for the temperature properties of the electronic material and elements, which is composed of a sample frame, a temperature changer and a temperature testing thermocouple. The testing device is suitable for testing low-frequency bands, with simple structure, low cost and little testing expenses.