Observer with atomic force microscope
The utility model relates to a visualizer, which is matched with an atomic force microscope, and comprises a rough focusing mechanism and a fine focusing mechanism, wherein, the rough focusing mechanism swivels a hand wheel so as to rotate a screw rod connected with the rotating hand wheel and arran...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | The utility model relates to a visualizer, which is matched with an atomic force microscope, and comprises a rough focusing mechanism and a fine focusing mechanism, wherein, the rough focusing mechanism swivels a hand wheel so as to rotate a screw rod connected with the rotating hand wheel and arranged in an upright post, and drives a supporting arm which is stretched into the upright post from a guide hole and connected with machine frame to move up and down, and the fine focusing mechanism is provided with an outer sleeve for placing a movable lens and movably connected with the machine frame. The visualizer is also provided with two central optical axes which are mutually vertical, wherein, the first central light axis has light beams which are emitted by a light beam emission plane of a light emission fiber bundle that is stretched in the machine frame and transmitted to a half-reflecting and half-permeating beam splitter prism through an illuminating lens, and the second central optical axis has the receiving surfaces of a movable lens, an immovable lens, the half-reflecting and half-permeating beam splitter prism, a rear lens and a camera head. Compared with an ordinary microscope in the prior art, the visualizer has simpler adjusting mechanisms, longer working distance of an object lens, and larger numerical aperture of the object lens, has the reflection type illumination of a joint light path between an illumination light path and an observation light path, and is suitable to be matched with the atomic force microscope. |
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