Multifunctional panel for chip test integrated measurement cabinet
The utility model discloses a multifunctional panel for a chip test integration measurement cabinet, which comprises a test cabinet and a panel window arranged on the test cabinet, the multifunctional panel comprises a connecting base detachably connected to the test cabinet and a turnover panel hin...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses a multifunctional panel for a chip test integration measurement cabinet, which comprises a test cabinet and a panel window arranged on the test cabinet, the multifunctional panel comprises a connecting base detachably connected to the test cabinet and a turnover panel hinged to one end of the connecting base, the connecting base is provided with a display panel and a PXIE panel, and the PXIE panel is provided with a plurality of LED chips. And the turnover panel can be turned over to be buckled with the panel window. The purpose of the utility model is to provide the multifunctional panel for the chip test integrated measurement cabinet, the display panel and the PXIE panel are protected through the turnover panel which can be turned to be buckled with the test cabinet, and the problem that maintenance personnel cannot check the display panel and the PXIE panel due to the fact that a cabinet door, a rear door, a side plate and the like of a cabinet cannot be opened due to narrow sp |
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