Test probe
The utility model provides a test probe, and relates to the technical field of semiconductor probes, in particular to an installation fixing plate connected with a test board, which comprises a lower copper column, a lower copper column, an upper copper column and a lower copper column, and one end...
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | The utility model provides a test probe, and relates to the technical field of semiconductor probes, in particular to an installation fixing plate connected with a test board, which comprises a lower copper column, a lower copper column, an upper copper column and a lower copper column, and one end of the lower copper column is provided with a connecting part in threaded connection with a test piece; one end of the upper copper column is connected with the lower copper column, and the other end of the upper copper column is connected with the mounting fixing plate through a mounting part; the upper copper column is connected with the lower copper column in an inserted mode, and the end, connected with the upper copper column, of the lower copper column is provided with a containing area used for allowing the end of the lower copper column to be inserted and matched with the end of the lower copper column, so that after the lower copper column is connected with a test piece through the connecting part, the end |
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