Small resistance value test circuit

The utility model discloses and provides a small resistance value test circuit which can effectively reduce test risks caused by small test points and unstable contact of a single probe, guarantee test stability and avoid increasing difficulty and cost of a project. The device comprises a first power supply probe P1, a second power supply probe P2, a sampling probe P3, a multiplexing probe P4, a current source A, a voltmeter V and a relay K, one end of the current source A is electrically connected with the first power supply probe P1, and the other end of the current source A is electrically connected with the sampling probe P3; one end of the voltmeter V is electrically connected with the second power supply probe P2, the other end of the voltmeter V is electrically connected with a normally open contact pin NO of the relay K, a common point pin COM of the relay K is electrically connected with the multiplexing probe P4, and the IIC communication test circuit is electrically connected with a normally closed