Double-probe chip testing device

The utility model relates to the technical field of detection devices, in particular to a double-probe chip testing device, which can quickly complete chip testing, improve efficiency and reduce labor intensity, and comprises a testing platform and testing equipment, a positioning block and a vertically arranged rodless cylinder are arranged on the testing platform, and the rodless cylinder is arranged on the testing platform. Vacuum adsorption ports are formed in the two sides of the positioning block respectively, a liftable test box is installed on the rodless cylinder, a fixed block is installed on the inner wall of the left side of the test box, a movable block is arranged on the inner wall of the right side of the test box, the movable block is connected with a test cylinder on the inner wall of the test box, a first probe is inserted into the fixed block, and a second probe is inserted into the movable block. A second probe is inserted into the movable block, the first probe and the second probe are co