Kelvin meter pen for testing semiconductor device

A Kelvin meter pen for testing a semiconductor device comprises two meter pens, the two meter pens can be combined together through magnets arranged on pen bodies, and the end portions of the pen bodies of the two meter pens are respectively provided with a probe, namely a pen point. When the two pen bodies are combined together, Kelvin connection is realized; the pair of probes, namely nibs, outputs test information from the test interface of the meter pen after passing through the bridge circuit of the pen body. 一种半导体器件测试用开尔文表笔，包括两个表笔，两个表笔能够通过笔身上设置的磁铁合在一起，两个表笔笔身的端部各设有一探头即笔尖；两个笔身合在一起时实现开尔文连接；一对探头即笔尖经笔身的电桥电路后从表笔的测试接口输出测试信息。