IC material belt inspection device
The utility model discloses an IC material belt inspection device which comprises a device main body, a control unit is arranged in the device main body, the device main body comprises a main body upper body and a main body lower body, a bottom plate is arranged on the main body upper body, a suppor...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses an IC material belt inspection device which comprises a device main body, a control unit is arranged in the device main body, the device main body comprises a main body upper body and a main body lower body, a bottom plate is arranged on the main body upper body, a supporting rod is arranged on the bottom plate, and the supporting rod extends out of the two sides of the main body upper body; the supporting rod is provided with a driving unit which is used for unfolding the to-be-detected IC material belt for detection under the control of the control unit. According to the invention, the IC material belt can be automatically unfolded, so that the workload of operators can be reduced.
本公开揭示了一种IC料带检验装置,包括:装置主体,所述装置主体内设置有控制单元,所述装置主体包括主体上体和主体下体,主体上体上设置有底板,底板上设置有支撑杆,支撑杆向主体上体两侧外延伸,支撑杆上设置有在控制单元控制下用于将待测IC料带展开以进行检测的驱动单元。本公开能够自动将IC料带展开,从而能够减轻作业人员的工作负担。 |
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