Multilayer chip ceramic dielectric capacitor detection contact device

The utility model relates to the technical field of electronic component inspection, in particular to a multilayer chip ceramic dielectric capacitor detection contact device, which comprises a test station, the surface of the test station is fixedly connected with a blanking streamline, the surface of the blanking streamline is fixedly connected with a Root manipulator, and the surface of the Root manipulator is fixedly connected with a CCD/screw lock pair. The CCD/screw locking surface is fixedly connected with a feeding streamline, the surface of the feeding streamline is fixedly connected with an NG streamline, and the surface of the NG streamline is fixedly connected with a locking transfer module. The position of the test station is located on the right side of the blanking streamline; the number of the Root mechanical arms is two, and the two Root mechanical arms are distributed in the front-back direction. The CCD/screw lock pair, the feeding streamline and the NG streamline are located in the same dir