Semiconductor test circuit and system

The utility model belongs to the technical field of semiconductors, and provides a semiconductor test circuit and system, and the circuit comprises a constant current sub-circuit, a relay Y1, a first control module, and a maintenance module. The constant current sub-circuit is connected with an eighth pin and a fifth pin of the relay Y1, a first pin and a second pin of the relay Y1 are connected with the first control module, a fourth pin of the relay Y1 is connected with a control end of a to-be-tested device, a sixth pin of the relay Y1 is connected with a second end of the to-be-tested device, and a seventh pin of the relay Y1 is connected with a first end of the to-be-tested device; the fourth pin of the relay Y1 is further used for being connected with a high-voltage power source, the first control module is further used for being connected with a controller, the constant-current sub-circuit is further connected with a first power source, the first end of the maintaining module is connected with the firs