Porous sample table capable of positioning and tracing electron microscope

The utility model discloses a porous sample table capable of positioning and tracing an electron microscope, relates to the technical field of electron microscope inspection, and aims to solve the problems that the basic positioning function of the existing electron microscope can be realized only when a sample is always on a sample table plate, and the original position of the sample cannot be reset after the sample is taken down from the sample table plate. In order to solve the problems that in the prior art, a sample can not be positioned and traced any more, and certain limitation exists in the using process, the following scheme is provided: the device comprises a porous sample table plate, the top of the porous sample table plate is provided with a plurality of fixing holes and a plurality of positioning grooves, and the top of the porous sample table plate is provided with a first identification serial number; and a sample base is placed on the porous sample bedplate. According to the utility model, t