Plasma emission spectrum detector based on full spectrum measurement
The utility model discloses a plasma emission spectrum detector based on full-spectrum measurement. The device comprises an ionization gas chamber, a reflector group arranged on one side of the ionization gas chamber, a slit arranged on the other side of the ionization gas chamber, a condensing lens...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses a plasma emission spectrum detector based on full-spectrum measurement. The device comprises an ionization gas chamber, a reflector group arranged on one side of the ionization gas chamber, a slit arranged on the other side of the ionization gas chamber, a condensing lens used for transmitting light from the reflector group and the slit, a spectro-grating used for dispersing incident light from the condensing lens, and a photoelectric detector used for detecting dispersion light from the spectro-grating, and the amplifying circuit is used for receiving output information from the photoelectric detector. Thus, the plasma technology and the special filtering technology are combined and applied to the gas chromatograph, and the gas chromatograph and instrument detection can be no longer limited by the pattern that the gas trace impurity content concentration is 0.1 ppbv/v.
一种基于全光谱测量的等离子发射光谱检测器,其包括:电离气室、布置于电离气室的一侧的反射镜组、布置于电离气室的另一侧的狭缝、用于透过来自反射镜组和狭缝的光的聚光透镜、用于对来自聚光透镜的入射光进行色散的分光光栅、用于检测来自分光 |
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