Test seat for adjusting contact position of probe

The utility model relates to the technical field of chip testing, in particular to a testing seat for adjusting the contact position of a probe, which comprises a testing seat and a positioning plate, grooves are arranged at four corners of the bottom of the testing seat, positioning pins and testing seat screw holes are connected in the grooves, and four positioning blocks are arranged on the surface of the positioning plate. The positioning blocks are respectively provided with a through positioning block screw hole and a positioning hole, the positioning pin is clamped in the positioning hole, the positioning block screw hole is in threaded fit with an inner hexagon bolt, and the inner hexagon bolt is sleeved with a spring. Therefore, the probe which is not contacted in place is contacted with the contact point of the PCB again, and the phenomenon of poor contact is avoided. 本实用新型涉及芯片测试技术领域,尤其涉及一种调节探针接触位置的测试座,包括测试座和定位板，测试座底部四个角落设置有凹槽，凹槽内连接有定位销和测试座螺丝孔，定位板表面设置有四个定位块，定位块分别开设有贯穿的定位块螺丝孔和定位孔，定位销卡入定位孔中，定位块螺丝孔螺纹配合