Testing device

The utility model discloses a testing device which is used for testing a chip, the testing device comprises a base and a cover body, one end of the base is connected with the cover body, and the cover body rotatably covers the base; a positioning hole is formed in the base, a test piece is arranged in the positioning hole, a pressing piece is arranged at the position, corresponding to the positioning hole, of the cover body, the chip is placed on the test piece, and the pressing piece is used for pressing the chip and the test piece; a heat conduction piece is arranged on the side, away from the pressing piece, of the cover body, the heat conduction piece is connected with the pressing piece, and the pressing piece and the heat conduction piece are both made of heat conduction materials. By means of the mode, the temperature of the tested chip tends to be consistent with the external environment, and the chip testing accuracy is guaranteed. 本申请公开了一种测试装置，用于测试芯片，所述测试装置包括底座和盖体，所述底座的一端与所述盖体连接，所述盖体可转动盖合在所述底座上方；所述底