Capacitance film thickness measuring device
The utility model relates to the related technical field of film thickness measurement, in particular to a capacitance film thickness measuring device, which comprises a mounting base used for mounting the thickness measuring device, a first conveying roller and a second conveying roller which are u...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model relates to the related technical field of film thickness measurement, in particular to a capacitance film thickness measuring device, which comprises a mounting base used for mounting the thickness measuring device, a first conveying roller and a second conveying roller which are used for conveying capacitance films are arranged at the upper part of the mounting base, and the first conveying roller and the second conveying roller rotate synchronously. According to the utility model, the purpose of mounting the thickness measuring device is achieved through the arrangement of the mounting base, and through the synchronous rotation of the first conveying roller and the second conveying roller which have the same roller diameter, the situation that the film is folded and the like in the conveying process is avoided, so that the purpose that the thickness measuring probe can effectively measure the thickness of the film is ensured; and meanwhile, the height of the detection roller can be adjuste |
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