Multi-purpose fixture for HTGB aging test of silicon carbide MOS device

A multipurpose fixture for an HTGB aging experiment of a silicon carbide MOS device comprises a bottom plate, the bottom plate is provided with a plurality of electrically connected testing and aging units, and the electrical connection process of each unit is as follows: one electrode is connected with a voltage input end of the device, and three electrode is connected with signal output ends of the device; the voltage input end and the signal output end of the device well meet the insertion sizes of corresponding input and output of pins of the two silicon carbide MOS devices. 一种碳化硅MOS器件的HTGB老化实验多用途夹具，包括底板，所述底板安装多个电连接的测试与老化单元，每个单元的电连接过程如下：一个电极接器件的电压输入端，设有三个电极接器件的信号输出端；所述电压输入端与器件的信号输出端正好满足两种碳化硅MOS器件管脚对应输入与输出的插入尺寸。