Chip testing and sorting machine capable of automatically and cyclically grading
The utility model discloses a chip testing and sorting machine with an automatic circulation grading function, which comprises a rack, a material storage mechanism, a material tray carrying arm, a circulation feeding platform, a testing and material taking mechanism and a material distribution carry...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses a chip testing and sorting machine with an automatic circulation grading function, which comprises a rack, a material storage mechanism, a material tray carrying arm, a circulation feeding platform, a testing and material taking mechanism and a material distribution carrying arm, and the rack is provided with a sorting area and a testing area; the at least two groups of storage mechanisms are arranged in the sorting area at intervals; the tray moving arm is erected above the sorting area; the circulating feeding platform is arranged in the testing area; the test material taking mechanism is erected on the circulating feeding platform; and the material distribution carrying arm is erected on the material storage mechanisms, takes out the tested chips from the material trays, and puts the chips into the material trays at different material storage mechanisms according to test results. According to the utility model, automatic circulating separate tray supply of material trays, circul |
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