Glass condition measuring equipment

A measurement device includes: a measurement probe; a support structure; the cantilever extends between the supporting structure and the measuring probe; and a support arm extending between the support structure and the cantilever arm. The cantilever arm is movably connected to the support arm. 一种测量...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KIMBLE III EDWARD LEE, ISAZA JUAN CAMILO, RIEGER KEVIN SCOTT, DE ANGELIS GILBERT
Format: Patent
Sprache:chi ; eng
Schlagworte:
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Beschreibung
Zusammenfassung:A measurement device includes: a measurement probe; a support structure; the cantilever extends between the supporting structure and the measuring probe; and a support arm extending between the support structure and the cantilever arm. The cantilever arm is movably connected to the support arm. 一种测量设备包括:测量探头;支撑结构;悬臂,所述悬臂在所述支撑结构与所述测量探头之间延伸;以及支撑臂,所述支撑臂在所述支撑结构与所述悬臂之间延伸。所述悬臂可移动地连接到所述支撑臂。