Microspur detection device for appearance defect detection

The utility model relates to the technical field of appearance detection of electronic products, in particular to a microspur detection device for appearance defect detection. The micro-distance detection device comprises a micro-distance BG surface detection part and a micro-distance CG surface det...

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Bibliographische Detailangaben
Hauptverfasser: YANG JEONG-NAM, WANG MENGZHE, LAI MIANLI, LI ENQUAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The utility model relates to the technical field of appearance detection of electronic products, in particular to a microspur detection device for appearance defect detection. The micro-distance detection device comprises a micro-distance BG surface detection part and a micro-distance CG surface detection part; a microspur detection first station and a microspur detection second station are arranged at the microspur CG surface detection part; and a microspur detection third station, a microspur detection fourth station, a microspur detection fifth station and a microspur detection sixth station are arranged at the microspur BG surface detection part. Through the multiple stations, the parts where appearance defects are prone to occurring can be well covered, and therefore the detection rate of defective products is increased. 本发明涉及电子产品外观检测技术领域,具体地说,涉及一种用于外观缺陷检测的微距检测装置。微距检测装置包括微距BG面检测部、微距CG面检测部;微距CG面检测部处布置有微距检测第一工位和微距检测第二工位;微距BG面检测部处布置有微距检测第三工位、微距检测第四工位、微距检测第五工位和微距检测第六工位。通过多工位能够较佳地对于易出现外观缺陷的部位进行覆盖,从而提高不良品检出率。