Temperature control device for semiconductor chip test card

The utility model relates to the technical field of semiconductor chips, and provides a semiconductor chip test card temperature control device comprising a housing, one side of the interior of the housing is vertically provided with a rotating groove, and the lower parts of the inner walls of the two sides of the rotating groove are rotatably connected with rotating rods through bearings. The side, arranged in the rotating groove, of the rotating rod penetrates through the middle of a first belt wheel and is fixedly connected with the first belt wheel, a rotary knob is fixedly installed at the end, arranged on the outer side of the shell, of the rotating rod, the first belt wheel is in transmission connection with a second belt wheel through a transmission belt, and a sliding groove is horizontally formed in the upper portion of the interior of the shell. The inner walls of the two sides of the sliding groove are rotationally connected with two-way lead screws through bearings, the two sides of the interior