Semiconductor visual inspection device

The utility model discloses a semiconductor visual inspection device which comprises a base, a conveying belt is fixedly installed at the top of the base, two symmetrically-distributed stand columns are fixedly installed at the top of the base, a bearing frame is arranged between the two stand colum...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LIANG CHENGMIN, YAN JINGJING
Format: Patent
Sprache:chi ; eng
Schlagworte:
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Beschreibung
Zusammenfassung:The utility model discloses a semiconductor visual inspection device which comprises a base, a conveying belt is fixedly installed at the top of the base, two symmetrically-distributed stand columns are fixedly installed at the top of the base, a bearing frame is arranged between the two stand columns, and an electric telescopic rod is fixedly installed at the bottom of the bearing frame. An industrial camera is fixedly installed at the bottom end of the electric telescopic rod, LED lamps are fixedly installed at the bottoms of the two ends of the bearing frame, a horizontal moving mechanism for horizontally moving and adjusting the bearing frame is fixedly installed on the stand column, a dust removal mechanism is arranged on one side of the industrial camera, and a computer is fixedly installed on the base. The semiconductor visual inspection device can perform batch inspection, is high in adjustability, effectively improves image acquisition clearness, and further improves visual inspection accuracy. 本实用新型