Test fixture and chip test system
The utility model discloses a test fixture and a chip test system, and relates to the technical field of integrated chip testing, the test fixture and a to-be-tested chip are included, the to-be-tested chip comprises a first sub-chip, a second sub-chip, a first packaging ball and a second packaging...
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Hauptverfasser: | , , , |
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses a test fixture and a chip test system, and relates to the technical field of integrated chip testing, the test fixture and a to-be-tested chip are included, the to-be-tested chip comprises a first sub-chip, a second sub-chip, a first packaging ball and a second packaging ball, the first sub-chip and the second sub-chip are packaged in the to-be-tested chip, the first packaging ball and the second packaging ball are arranged on one side, facing the test fixture, of the to-be-tested chip, the first packaging ball is connected with the first sub-chip, and the second packaging ball is connected with the second sub-chip; the test fixture comprises a first sub-chip test board and a conversion board, and the conversion board is arranged between the to-be-tested chip and the first sub-chip test board and is used for connecting the first packaging ball with the first sub-chip test board; through the design, the detection is convenient, and the detection accuracy is ensured.
本申请公开了一种测试治具和芯片测 |
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