Chip test fixture

The utility model discloses a chip test fixture, which comprises a test substrate, a raising plate and a connector, and is characterized in that the raising plate is arranged on one side, facing the test substrate, of a mainboard, the connector is arranged between the test substrate and the raising...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WANG NIMING, XUE YUNI, GU HONGWEI, HU XIAOHUI
Format: Patent
Sprache:chi ; eng
Schlagworte:
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Beschreibung
Zusammenfassung:The utility model discloses a chip test fixture, which comprises a test substrate, a raising plate and a connector, and is characterized in that the raising plate is arranged on one side, facing the test substrate, of a mainboard, the connector is arranged between the test substrate and the raising plate, and a chip is arranged on one side, far away from the connector, of the test substrate; wherein the height of the heightening plate is higher than that of other electronic components on the mainboard; the connector comprises a first connecting piece and a second connecting piece, the first connecting piece is detachably connected with the second connecting piece, and the first connecting piece is connected with the chip through the test substrate; the second connecting piece is connected with the main plate through the heightening plate; through the above design, various mainboards are compatible, the signal influence is reduced, and disassembly and replacement are convenient. 本申请公开了一种芯片测试治具,包括测试基板、垫高板和连接器,所