Sample table with positioning function

The utility model discloses a sample table with a positioning function, relates to the technical field of sample observation by a scanning electron microscope, and aims to solve the problem that when the sample is observed by the scanning electron microscope (SEM) at present, fine particles in the s...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HU SUNLIN, CHEN QIUPING, ZHOU RUN, MO YUYE
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The utility model discloses a sample table with a positioning function, relates to the technical field of sample observation by a scanning electron microscope, and aims to solve the problem that when the sample is observed by the scanning electron microscope (SEM) at present, fine particles in the sample are difficult to locate when the sample is observed by the scanning electron microscope again after the sample is taken out after being observed for the first time. In order to solve the problems that a plurality of experimental results are difficult to recheck and the use effect is not ideal due to the fact that fine particles observed previously cannot be quickly and accurately found on a sample, the utility model provides the following scheme: the scanning electron microscope comprises a scanning electron microscope base, an insertion hole is formed in the top side of the scanning electron microscope base, and a sample table is arranged on the top side of the scanning electron microscope base; and an inser